Polymer Synthesis and Analysis Laboratory

Synchrotron Light Source


Feature

  • Small Angle X-ray Scattering (SAXS)
  • Wide Angle X-ray Diffraction (WAXD)
  • Grazing Incidence Small Angle X-ray Scattering (GISAXS)
  • Grazing Incidence X-ray Diffraction (GIXD)
  • Solution Small Angle X-ray Scattering
  • X-ray Reflectivity



Differential Scanning Calorimeter


Feature

  • Tm, Tg measurement
  • heat of fusion measurement
  • heat of crystallization measurement
  • heat of evaporation measurement

Components

  • Cooling system
  • flow controller
  • control computer



Thermal Mechanical Analyzer


Feature

  • Expansion
  • Glass transition
  • Softening, Swelling
  • Gel time
  • Creep, Stress-strain
  • Stress-relaxation
  • Young's modulus
  • Large volume TG



FT-InfraRed Spectrometer


Feature

  • Molecular structure analysis of unknown samples
  • Characterization of molecular functional groups

Components

  • DTG detector with focussing optics
  • Magnetic holder



1D Light Scattering System


Feature

  • Identification of Molecular structure
  • Research for polymer blend phase seperation
  • Characterization of micron scale polymer structure

Components

  • He-Ne Laser
  • PMT detector



X-Ray Diffractometer


Feature

  • Structure analysis of crystalline polymer
  • Qualitative/quantitative analysis of unknown samples
  • Characterization of molecular orientation
  • Characterization of crystal size and crystallization
Components
  • X-ray Generator
  • Rotating anode, Cu Target
  • Goniometer
  • Cooling heat exchanger
  • Counting & Control Driving Section



O 2 Workstation


Feature

  • Molecular Simulation
  • Molecular Dynamics
  • Structure Analysis
  • Model Builder

Components

  • Cerius2 Package Program
  • SGI IRIX 6.3/O2 R10000 workstation



  • AFM


    Feature

    • Measurement of Surface charactistric of thin film
    • (topography, elasticity, friction, adhesion, and magnetic/electrical fields)
    Components
    • Multimode AFM (Veeco)
    • Nanoscope IIIa Controller
    • Optical Viewing System (Nikon)
    • High Temperature Heating System
    • Heatable Fluid Cell



    Probe Station


    Feature

    • I-V & C-V Charateristics
    • Impedance Spectroscopy
    Components
    • Vacuum Chuck: 4" Brass
    • Micropositioners
    • Screw Type Tip Holder
    • Microscope
    • Illuminator



    LCR Meter


    Feature

    • Inductance, capacitance, and impedance measurement
    • Impedance Spectroscopy
    • Hihg electric field polar anchoring energy measurement
    Components
    • Agilent 4284A
    • Agilent 4284A-001 option



    Semiconductor Analyzer


    Feature

    • I-V & C-V Charateristics
    • Characterization of memory device
    Components
    • Keithely 4200-SCS
    • Preamps-0.1fA



    Variable Angle Spectroscopic Ellipsometer


    Feature

    • Optical constant (n, k) measurement
    • Thickness of thin films measurement
    • Characterization of optical anisotropy of thin films
    Components
    • Woollam VASE 32 analysis program
    • Liquid Cell



    Contact Angle Meter


    Feature

    • Surface/Interface Tension
    • Contact Angle Measured
    • Surface Free Energy Calculations
    • Model Builder

    Components

    • Light Source & Interface Unit
    • CCD Video Carmera & Optics
    • Stage & Syringe Adjustments
    • Software



    Prism Coupler


    Rubbing Machine




    Other Instruments

    • Thermogravimeter(TGA)
    • Residual stress analyzer
    • Alpha-stepper
    • 2-D Light Scattering system
    • Tilt angle measuring system
    • UV-exposure system
    • Incuvator
    • Birefringence analyzer
    • Glove box
    • Spin coater
    • Aspirator
    • Various synthetic kits


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