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Domestic Conference 게시판 목록
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20 J. Kim, J. Kim, H. Oh, J. W. Han, M. Meyyappan, and J.-S. Lee, ' Transfer Characteristics of Vacuum Channel FETs with Tip Positions of Emitter and Collector ', The 23th Korean Conference on Semiconductors (KCS 2016), 정선 하이원리조트, Feb. 22-24, 2016. 
19 J. Lee, H. Lee, J. Bo, and J.-S. Lee, ' Fabrication and Bias-Temperature Instability of Vertical Low-Temperature Poly-Si Thin-Film Transistor ', The 23th Korean Conference on Semiconductors (KCS 2016), 정선 하이원리조트, Feb. 22-24, 2016. 
18 H. Lee, J. Lee B. Jin, J. Kim, H. Oh, J. Kim, and J.-S. Lee, “Reliability Characteristics in Junctionless Poly-Si Thin-Film Transistors” The 23th Korean Conference on Semiconductors (KCS 2016), 정선 하이원리조트, Feb. 22-24, 2016 
17 S. Baek, J. Bo, C. Park, D. Kim, and J.-S. Lee, “Investigation of stress-induced instability of SiC DMOSFETs”, The 23th Korean Conference on Semiconductors (KCS 2016), 정선 하이원리조트, Feb. 22-24, 2016 
16 J. Kim, H.G Oh, T. Rim, C.-K. Baek, J.-S. Lee, 'Various Heterojunction Single Gate Tunneling FETs with Graded Channel Doping in Sub- 40 nm Channels', The 22th Korean Conference on Semiconductors (KCS 2015), 인천 송도컨벤시아, Feb. 10-12, 2015 
15 J. Kim, B. Jin, H. Oh, C.-K. Baek, J.-S. Lee, 'The Statistical Distribution of Electrical Characteristics with Random Grain Boundary in Vertical NAND Unit Cells', The 22th Korean Conference on Semiconductors (KCS 2015), 인천 송도컨벤시아, Feb. 10-12, 2015 
14 S. Jeong, J. Lee, B. Choi, M. Kang, J.-S. Lee, “Electrical Characteristics of Graphene Field Effect Transistors on Stainless Steel (STS) Substrate”, The 22th Korean Conference on Semiconductors (KCS 2015), 인천 송도컨벤시아, Feb. 10-12, 2015 
13 J. Kim, H.G Oh, J. Lee, J.W. Kim, C.-K. Baek, J.-S. Lee, “3D Simulation of Threshold Voltage Variations Due to Random Grain Boundary and Discrete Dopants in Sub-20 nm Gate-All-Around Poly-Si Transistors”, 한국반도체학술대회(KCS), Feb. 2014. 
12 J.W. Kim, T. Kim, B. Kim, J.-S. Lee, “An experimental verification of a scaled RC-dominant interconnect line model for High-speed wireline”, 한국반도체학술대회(KCS), Feb. 2014 
11 N. Hong, K. Kim, T. Rim, C. Park, C. K. Baek, J.-S. Lee, and Y. H. Jeong, 'Analysis of pseudo reference electrode in silicon nanowire ISFETs for hydrogen ion detection,' 2013 IEEK Fall Conference, Nov. 23, 2013, pp. 225-227 
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