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25 S. Baek, Bo Jin, C. Park, D. Kim, and J.–S.Lee, The 24th Korean Conference on Semiconductor(KCS 2017), 대명비발디파크, Feb. 13-15, 2017 
24 H. Oh, J. Kim, S. Jeong, T. Kim, H. Lee, J. –S. Lee, W. Choi, J. Lee and J.-s. Lee, The 24th Korean Conference on Semiconductor(KCS 2017), Feb 2017 
23 J. Kim, H. Oh, S. Baek, C. Park, N. Hong, D. Kim, Bo Jin, and J.-S. Lee, The 24th Korean Conference on Semiconductor(KCS 2017), 대명비발디파크, Feb 2017 
22 J. Lee, H. Lee, BO Jin, G. Yoon and J.-S. Lee, 2017년도 한국반도체디스플레이기술학회, 경북대, 대구, April. 27-28, 2017. 
21 C. Park, D. Kim, Y. Choi, Bo Jin and J.-S. Lee, 2017년도 한국반도체디스플레이기술학회, 경북대, 대구, April. 27-28, 2017. 
20 J. Kim, J. Kim, H. Oh, J. W. Han, M. Meyyappan, and J.-S. Lee, ' Transfer Characteristics of Vacuum Channel FETs with Tip Positions of Emitter and Collector ', The 23th Korean Conference on Semiconductors (KCS 2016), 정선 하이원리조트, Feb. 22-24, 2016. 
19 J. Lee, H. Lee, J. Bo, and J.-S. Lee, ' Fabrication and Bias-Temperature Instability of Vertical Low-Temperature Poly-Si Thin-Film Transistor ', The 23th Korean Conference on Semiconductors (KCS 2016), 정선 하이원리조트, Feb. 22-24, 2016. 
18 H. Lee, J. Lee B. Jin, J. Kim, H. Oh, J. Kim, and J.-S. Lee, “Reliability Characteristics in Junctionless Poly-Si Thin-Film Transistors” The 23th Korean Conference on Semiconductors (KCS 2016), 정선 하이원리조트, Feb. 22-24, 2016 
17 S. Baek, J. Bo, C. Park, D. Kim, and J.-S. Lee, “Investigation of stress-induced instability of SiC DMOSFETs”, The 23th Korean Conference on Semiconductors (KCS 2016), 정선 하이원리조트, Feb. 22-24, 2016 
16 J. Kim, H.G Oh, T. Rim, C.-K. Baek, J.-S. Lee, 'Various Heterojunction Single Gate Tunneling FETs with Graded Channel Doping in Sub- 40 nm Channels', The 22th Korean Conference on Semiconductors (KCS 2015), 인천 송도컨벤시아, Feb. 10-12, 2015 
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