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81 J. Kim, H. Oh, B. Jin, C.-K. Baek, and J.-S. Lee, 'The Electrical Variations due to Grain Boundary using Voronoi Method in Tunneling Field-Effect-Transistor (TFET) of Polysilicon Nanowire Channel,' NANO KOREA 2015 Symposium, Seoul(Coex), Korea, July 1-3, 2 
80 H. Oh, J. Kim, B. Jin, C.-K. Baek, and J.-S. Lee, “Electrical Variation of Vertical Macaroni NAND Cells due to Random Grain Boundary Using Voronoi Method,' NANO KOREA 2015 Symposium, Seoul(Coex), Korea, July 1-3, 2015. 
79 C. Park, K. Kim, D. Kim, N. Hong, M. Meyyappan, and J. –S. Lee, “Effects of Buffer Concentration on Sensing Performances of Ion-Sensitive Field-Effect Transistors with Si-Nanowires”, IEEE Nanp 2015, Rome, Italy, July 27-30, 2015 
78 J.-S. Lee, M. Meyyappan, “Novel biosensor platform based on Si-nanowire-Network Structure”, IEEE Nanoelectronics Conference, Sapporo, Hokkaido, Japan, Jul. 28-31, 2014. 
77 J. H. Hong, S. H. Lee, Y. R. Kim, E. Y. Jeong, J. S. Yoon, J. S. Lee, R. H. Baek, and Y. H. Jeong, 'Impact of High-ĸ Spacers on Parasitic Effects Considering DC/AC Performance Optimization in Si-Nanowire FETs for sub 10 nm Technology Node,' 2014 Internatio 
76 J. S. Yoon, E. Y. Jeong, S. H. Lee, Y. R. Kim, J. H. Hong, J. S. Lee, and Y. H. Jeong, 'Extraction of Source/Drain Series Resistance Components Optimized for Double-gate FinFETs,' 2014 International Conference on Solid State Devices and Materials, Tsukuba, 
75 E. Y. Jeong, M. J. Deen, C. H. Chen, R. H. Baek, J. S. Lee, and Y. H. Jeong, 'Physical DC and Thermal Noise Models of 18nm DG Junctionless pMOSFETs,' 2014 International Conference on Solid State Devices and Materials, Tsukuba, Japan, Sep. 2014. 
74 K. Kim, C. Park, T. Rim, M. Meyyappan, and J. S. Lee, 'Electrical and pH Sensing Characteristics of Si Nanowire-Based Suspended FET Biosensors,' The 14th International Conference on Nanotechnology, Toronto, Canada, Aug. 18-21, 2014. 
73 J. Kim, H. Oh, J. Lee, B. Jin, T. Rim, C.-K. Baek, M. Meyyappan, J.-S. Lee, “The Temperature Dependence of Threshold Voltage Variations due to Oblique Single Grain Boundary in 3D NAND Unit Cells”, Non-Volatile Memory Technology Workshop2014, Jeju, Korea,  
72 T. Rim, S. Kim, K. Kim, N. Hong, J. S. Lee, Y. H. Jeong, M. Meyyappan, and C. K. Baek, 'Noise Consideration for Cancer Marker Detection using Nanowire Sensors,' The 14th International Conference on Nanotechnology, Toronto, Canada, Aug. 18-21, 2014.