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97 N. Hong, K. Kim, C. Park, D. Kim, J.-S. Lee, “Electrical Characteristics of Electrolyte-Oxide-Silicon (EOS) capacitor with the gold nanoparticle (AuNPs) attachments”, 22th Korean Conference on Semiconductors, Feb. 10~12, 2015.  -
96 N. Hong, K. Kim, T. Rim, C. Park, C. K. Baek, J. S. Lee, and Y. H. Jeong, 'Analysis of pseudo reference electrode in silicon nanowire ISFETs for hydrogen ion detection,' 2013 IEEK Fall Conference, Nov. 23, 2013, pp. 225-227  -
95 S. H. Kam, O. S. Kwon, and Y. H. Jeong, "A Wideband Doherty Power Amplifier Using Branch Load Impedance," 2012 IEEK Summer Conference, Jun. 27~29, 2012, vol. 35, no. 1, pp. 616-617.   -
94 O. S. Kwon, S. H. Kam, and Y. H. Jeong, "A Broadband 3-way Asymmetric Doherty Power Amplifier for High Efficiency," 2012 IEEK Summer Conference, Jun. 27~29, 2012, vol. 35, no. 1, pp. 618-619.  -
93 D. Y. Choi, C. W. Sohn, H. C. Sagong, E. Y. Jeong, J. W. Jang, J. S. Lee, and Y. H. Jeong, "Dielectric Degradation and Breakdown of High-k/Metal Gate Stack nMOSFETs," 2012 IEEK Summer Conference, Jun. 27~29, 2012, vol. 35, no. 1, pp. 367-369.   -
92 S. H. Lee, R. H. Baek, C. K. Baek, C. H. Park, M. D. Ko, K. H. Yeo, D. W. Kim, D. M. Kim, and Y. H. Jeong, "Investigation of GIDL Behavior in Si-Nanowire FET with Hot Carrier Stress," 18th Korean Conference on Semiconductors, Feb. 16~18, 2011  -
91 E. Y. Jeong, C. W. Sohn, M. S. Park, D. Y. Choi, H. C. Sagong, C. Y. Kang, and Y. H. Jeong, "Hot Carrier Effect on RF Characteristics of 100-nm High-k/Metal Gate SiGe Channel pMOSFETs," 18th Korean Conference on Semiconductors, Feb. 16~18, 2011  -
90 S. H. Kam, M. W. Lee, Y. S. Lee, and Y. H. Jeong, "A High-Linearity Three-way Doherty Power Amplifier with Unsymmetrical Delay Path," 2010 IEEK Summer Conference, Jun. 16~18, 2010, vol. 33, no. 1, pp. 918-919.  -
89 M. W. Lee, S. H. Kam, Y. S. Lee, and Y. H. Jeong, "Highly Efficient 3-Stage Inverted Doherty Power Amplifier with Adaptive Gate Bias Controller," 2010 IEEK Summer Conference, Jun. 16~18, 2010, vol. 33, no. 1, pp. 945-946.  -
88 S. H Lee, R. H. Baek, C. H. Park, M. D. Ko, and Y. H. Jeong, "GIDL Analysis pf Underlap Double Gate MOSFET with Various Channel Thickness and Doping Using Quantum Simulation," 2010 IEEK Summer Conference, Jun. 16~18, 2010, vol. 33, no. 1, pp. 475-476  -