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154 T. Rim, S. Kim, N. Hong, J. S. Lee, Y. H. Jeong, M. Meyyappan, and C. K. Baek, 'Noise Consideration for Cancer Marker Detection using Nanowire,' Proceedings of the 14th IEEE International Conference on Nanotechnology, Toronto, Canada, Aug. 2014.  -
153 E. Y. Jeong, M. J. Deen, C. H. Chen, R. H. Baek, J. S. Lee, and Y. H. Jeong, 'Physical DC and Thermal Noise Models of 18nm DG Junctionless pMOSFETs,' 2014 International Conference on Solid State Devices and Materials, Tsukuba, Japan, Sep. 2014.  -
152 J. S. Yoon et al., 'Extraction of Source/Drain Series Resistance Components Optimized for Double-gate FinFETs,' 2014 International Conference on Solid State Devices and Materials, Tsukuba, Japan, Sep. 2014.  -
151 J. H. Hong et al., 'Impact of High-ĸ Spacers on Parasitic Effects Considering DC/AC Performance Optimization in Si-Nanowire FETs for sub 10 nm Technology Node,' 2014 International Conference on Solid State Devices and Materials, Tsukuba, Japan, Sep. 2014.  -
150 J. W. Jang, S. Park, Y. H. Jeong, and H. Hwang, 'ReRAM-based synaptic device for neuromorphic computing,' 2014 IEEE International Symposium on Circuits and Systems, Melbourne, Australia, Jun. 1-5, 2014.  -
149 E. Y. Jeong, Y. H. Jeong, C. H. Chen and M. J. Deen, 'DC and Thermal Noise Modeling of 20 nm Double-Gate Junctionless MOSFETs,' 2013 22nd International Conference on Noise and Fluctuations, Montpellier, France, Jun. 23-28, 2013.  -
148 S. H. Lee et al., 'Characterization of Low Frequency Noise in Nanowire FETs Considering Variability and Quantum Effects,' 2013 71st Annual Device Research Conference, Notre Dame, USA, Jun. 23-26, 2013.  -
147 C. H. Park et al., 'Extraction of Series Resistance on Junctionless and Inversion-mode nanowire FET through the Method based on Y-function,' 2013 71st Annual Device Research Conference, Notre Dame, USA, Jun. 23-26, 2013.  -
146 S. H. Kam, O. S. Kwon, and Y. H. Jeong, "A Broadband Envelope Tracking Power Amplifier Design Based on Distributed Structure for LTE Application," 2013 International Conference on elctronics, Information and Communication, Bali, Indonesia, Jan. 30 - Feb. 2, 2013.  -
145 C. W. Sohn, M. D. Ko, C. Y. Kang, R. H. Baek, D. Y. Choi, H. C. Sagong, E. Y. Jeong, C. K. Baek, J. S. Lee, P. Kirsch, R. Jammy, J. Lee, and Y. H. Jeong, "Modeling and Analysis of the Parasitic Series Resistance in Raised Source/Drain FinFETs with Polygonal Epitaxy," International Conference on Simulation of Semiconductor Processes and Devices, Denver, Colorado, USA, Sep. 5-7, 2012.  -