회원로그인 login

로그인영역
Materials Characterization



1. Course Information
Instructor: Prof. Sang Ho Oh
Course #: AMSE 507
Credit: 3
Hours: Monday/Wednesday 14:00-15:15
    Engineering Bldg. #1, Room 202



2. Course Objectives
This course aims to deliver underlying physical backgrounds and fundamental working principles of scientific instruments 
for materials characterization. Instead of merely introducing diverse instruments, the lecture mainly focuses on the 
basic theories of microscopy and spectroscopy techniques which are used for materials characterization at different 
levels (sub-atomic to macroscopic). Upon completion of this course, the students will be familiar with basic principles 
of sophisticated scientific instruments and the acquired knowledge can be easily extended to other instruments.



3. Prerequisites & Require
None.



4. Course Materials
Materials characterization - Lecture Notes
1. Yang Leng, “Materials Characterization: Introduction to Microscopic and Spectroscopic Methods”, 
John Wiley & Sons Co. (2008).
2. David Brandon & Wayne D. Kaplan, “Microstructural Characterization of Materials”, 2nd edition, 
John Wiley & Sons Co. (2008).
3. R. W. Cahn, P. Haasen, E. J. Kramer (ed.), “Materials Science and Technology: A Comprehensive Treatment”, 
Vol. 2A & B Characterization of Materials, VCH (1992)
4. C. R. Brundle, C. A. Evans, Jr., S. Wilson (ed.), “Encyclopedia of Materials Characterization: Surfaces, Interfaces, 
Thin Films”, Butterworth-Heinemann (1992).



5. Course Plan
1. Introduction: Overview of materials characterization
2. Common constituents of instruments:
  - Signal generation device
  - Filter and analyzer
  - Sensor and detector
3. Atomic spectroscopy
  - Atomic Absorption Spectroscopy (AAS)
  - Atomic Emission Spectroscopy (AES)
  - Atomic Fluorescence Spectroscopy (AFS)
4. Spectroscopy
  - X-ray spectroscopy for elemental analysis
  - Electron spectroscopy for surface analysis
  - Ion spectroscopy (SIMS, RBS)
  - Vibrational spectroscopy for molecular analysis
5. Microscopy
  - Optical Microscopy (OM)
  - Scanning Electron Microscopy (SEM)
  - Focused Ion Beam (FIB)
  - Transmission Electron Microscopy (TEM)
  - Scanning Probe Microscopy (AFM, STM)
  - Atom Probe
6. Thermoanalytical methods
  - Thermo-Gravimetric Analysis (TGA)
  - Differential Thermal Analysis (DTA)
  - Differential Scanning Calorimetry (DSC)
  - Thermo-Mechanical Analysis (TMA)