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Transmission Electron Microscopy

JEOL-2100F

The JEM-2100F is an advanced Field Emission Electron Microscope featuring ultrahigh resolution and rapid data acquisition. The JEM-2100F has been developed to achieve the highest image quality and the highest analytical performance in the 200KV class analytical TEM with a probe size under 0.5nm. The new-side entry goniometer stage provides ease of use tilt, rotation, heating and cooling, programmable multi-point settings– all without mechanical drift. The JEM-2100F can be equipped with STEM, MDS, EDS, EELS, and CCD-camera.